Keithley 2521 Mil Switching free download

File name 2521 Mil Switching.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E (a) Switch Systems (b) for Aerospace and Defense Testing Jerry A. Janesch, Alan Ivons, A switching system can be as simple as the Keithley Model 7999-4 SPDT Microwave switch (a) or as large as one based on the Model 7002 ten-slot Keithley Instruments, Inc., Cleveland, Ohio mainframe (b). Testing for state-of-the-art systems requires with different instruments can be run on the Configuration of a switch system choosing the appropriate switching systems same DUT or multiple instruments can test Switch systems can be simple or elabo- and applying them correctly. multiple DUTs. For example, in Figure 1 a rate. For example, a single-pole, double- D switching system makes it possible to test a throw (SPDT) switch can be used to route EFENSE and aerospace electron- large number of tactical radios undergoing signals to two different DUTs, as shown in ic systems cover an enormous burn-in in an environmental chamber. This Figure 2a. It can be expanded further into a range, from active devices, such article will briefly discuss several important "multiplexer" configuration, so that a single as radio frequency integrated aspects of configuring a switch system. instrument can be routed to many different circuits (RFICs) and microwave monolithic integrated circuits (MMICs), to remote sensing devices, to complete space communication systems. All of these require extensive testing at all stages of development and production with testing requirements that cover an equally broad range: DC meas- urements from femtoamperes to amperes, and from nanovolts to kilovolts, and RF/mi- crowave measurements from a few MHz to beyond 40GHz. Despite this variety, tests in all these areas share one important characteristic: Automation can make them faster and more repeatable and help to reduce operator er- ror. An essential part of automated testing is a switching system, which routes signals between measurement instruments and the Figure 1: In a typical lifetime test, the DUT (here a handheld tactical radio) can be stressed at an device under test (DUT). Multiple tests elevated level for a specified period, then its electrical characteristics can be measured. Switch Systems for Aerospace and Defense Testing May 2004 1